Dissertation:
"A BiCMOS Active Substrate Probe Card Technology for Digital Testing," Ph.D. Dissertation, Technical Report No ICL97-070, Stanford University, March. 1997.
Publications:
M. Zargari and Bruce A. Wooley,"A BiCMOS Active Substrate Probe Card for High-Performance Testing," presented at 1995 Southwest Test Workshop - Wafer Level Testing, June 1995.
M. Zargari and Bruce A. Wooley,"A BiCMOS Active Pull-Down ECL Output Driver for Low Power Applications," 1995 Symp. Low Power Electronics, pp. 50-51, Oct. 1995.
M. Zargari, J. Leung, S. S. Wong, and Bruce A. Wooley,"A BiCMOS Active Substrate Probe Card Technology for Digital Testing," ISSCC Dig. Tech. Papers, pp. 308-309, Feb. 1996.
J. Leung, M. Zargari, S. S. Wong, and Bruce A. Wooley,"Active Substrate Membrane Probe Card," presented at SRC TECHCON '96, Phoenix, AZ, Sept. 1996.
Integrated Circuits Lab